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Beschreibung
Pattern recognition presents a significant challege for scientists and engineers, and many different approaches have been proposed. This book provides a self-contained account of probabilistic techniques that have been applied to the subject. Researchers and graduate students will benefit from this wide-ranging account of the field.
Pattern recognition presents a significant challege for scientists and engineers, and many different approaches have been proposed. This book provides a self-contained account of probabilistic techniques that have been applied to the subject. Researchers and graduate students will benefit from this wide-ranging account of the field.
Zusammenfassung
Pattern recognition presents a significant challege for scientists and engineers, and many different approaches have been proposed. This book provides a self-contained account of probabilistic techniques that have been applied to the subject. Researchers and graduate students will benefit from this wide-ranging account of the field.
Inhaltsverzeichnis
Preface * Introduction * The Bayes Error * Inequalities and alternate
distance measures * Linear discrimination * Nearest neighbor rules *
Consistency * Slow rates of convergence Error estimation * The regular
histogram rule * Kernel rules Consistency of the k-nearest neighbor
rule * Vapnik-Chervonenkis theory * Combinatorial aspects of Vapnik-
Chervonenkis theory * Lower bounds for empirical classifier selection
* The maximum likelihood principle * Parametric classification *
Generalized linear discrimination * Complexity regularization *
Condensed and edited nearest neighbor rules * Tree classifiers * Data-
dependent partitioning * Splitting the data * The resubstitution
estimate * Deleted estimates of the error probability * Automatic
kernel rules * Automatic nearest neighbor rules * Hypercubes and
discrete spaces * Epsilon entropy and totally bounded sets * Uniform
laws of large numbers * Neural networks * Other error estimates *
Feature extraction * Appendix * Notation * References * Index
Details
Erscheinungsjahr: 2013
Fachbereich: Wahrscheinlichkeitstheorie
Genre: Importe, Mathematik
Rubrik: Naturwissenschaften & Technik
Medium: Taschenbuch
Reihe: Stochastic Modelling and Applied Probability
Inhalt: xv
638 S.
ISBN-13: 9781461268772
ISBN-10: 146126877X
Sprache: Englisch
Einband: Kartoniert / Broschiert
Autor: Devroye, Luc
Györfi, Laszlo
Lugosi, Gabor
Hersteller: Humana
Springer
Springer US, New York, N.Y.
Stochastic Modelling and Applied Probability
Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, D-69121 Heidelberg, juergen.hartmann@springer.com
Maße: 235 x 155 x 36 mm
Von/Mit: Luc Devroye (u. a.)
Erscheinungsdatum: 22.11.2013
Gewicht: 0,984 kg
Artikel-ID: 105322850

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