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A comprehensive and accessible introduction to the characterization of condensed materials
The characterization of condensed materials is a crucial aspect of materials science. The science underlying this area of research and analysis is interdisciplinary, combining electromagnetic spectroscopy, surface and interface testing methods, physiochemical analysis methods, and more. All of this must be brought to bear in order to understand the relationship between microstructures and larger-scale properties of condensed matter.
Characterization of Condensed Matter: An Introduction to Composition, Microstructure, and Surface Methods introduces the technologies involved in the characterization of condensed matter and their many applications. It incorporates more than a decades' experience in teaching a successful undergraduate course in the subject and emphasizes accessibility and continuously reinforced learning. The result is a survey which promises to equip students with both underlying theory and real experimental instances of condensed matter characterization.
Characterization of Condensed Matter readers will also find:
- Detailed treatment of techniques including electromagnetic spectroscopy, X-ray diffraction, X-ray absorption, electron microscopy, surface and element analysis, and more
- Incorporation of concrete experimental examples for each technique
- Exercises at the end of each chapter to facilitate understanding
Characterization of Condensed Matter is a useful reference for undergraduates and early-career graduate students seeking a foundation and reference for these essential techniques.
A comprehensive and accessible introduction to the characterization of condensed materials
The characterization of condensed materials is a crucial aspect of materials science. The science underlying this area of research and analysis is interdisciplinary, combining electromagnetic spectroscopy, surface and interface testing methods, physiochemical analysis methods, and more. All of this must be brought to bear in order to understand the relationship between microstructures and larger-scale properties of condensed matter.
Characterization of Condensed Matter: An Introduction to Composition, Microstructure, and Surface Methods introduces the technologies involved in the characterization of condensed matter and their many applications. It incorporates more than a decades' experience in teaching a successful undergraduate course in the subject and emphasizes accessibility and continuously reinforced learning. The result is a survey which promises to equip students with both underlying theory and real experimental instances of condensed matter characterization.
Characterization of Condensed Matter readers will also find:
- Detailed treatment of techniques including electromagnetic spectroscopy, X-ray diffraction, X-ray absorption, electron microscopy, surface and element analysis, and more
- Incorporation of concrete experimental examples for each technique
- Exercises at the end of each chapter to facilitate understanding
Characterization of Condensed Matter is a useful reference for undergraduates and early-career graduate students seeking a foundation and reference for these essential techniques.
Qingwei Liao received her PhD degree from Tianjin University, China, in Microelectronics, in 2012, visited Harvard University for one year from 2018 to 2019, and is currently an Associate Professor of Beijing Information Science and Technology University. She has published more than 60 SCI-indexed journal papers. Her research area include: applied physics, nano materials, sensing technology and energy conversion, absorbing materials, ferro/piezo materials. She serves as the main lecturer of courses like Modern analytical testing methods for graduate students.
Chapter 1. Universe, Matter, Condensed Matter and Materials
Chapter 2. Laser Interferometer Gravitational Wave Observatory
Chapter 3. Fundamentals of Crystallography for Microstructure Characterization of Condensed Matter
PART II. Electromagnetic Spectroscopy
Chapter 4. Element of X-Ray Diffraction
Chapter 5. X-Ray Fluorescence Spectroscopy (XRF)
Chapter 6. X-Ray Emission Spectroscopy (XES)
Chapter 7. X-Ray Absorption Spectroscopy (XAS): X-Ray Absorption Near Edge Structure (XANES) and Extended X-Ray Absorption Fine Structure (EXAFS)
Chapter 8. X-Ray Raman Scattering (XRS(
Chapter 9. Fourier Transform Infrared Spectroscopy (FTIR)
Chapter 10. Energy Dispersive X-Ray Spectrum of Elements (EDX)
PART III. Characterization Methods Based on the Particle (Electron or Electron Beam, Neutron)-Matter Interaction
Chapter 11. Scanning Electron Microscope (SEM)
Chapter 12. Transmission Electron Microscope (TEM)
Chapter 13. Spherical Aberration Corrected Transmission Electron Microscope (SAC-TEM)
Chapter 14. Environmental Transmission Electron Microscope (ETEM)
Chapter 15. Holography
PART IV. Characterization Methods for Hyperfine Structures Related to the Magnetic Properties of Electrons and Nuclei
Chapter 16. Nuclear Magnetic Resonance Spectroscopy
Chapter 17. Mössbauer Effect and Mössbauer Spectroscopy
PART V. Surface Analysis Method
Chapter 18. Atomic Force Microscope (AFM)
Chapter 19. X-Ray Photoelectron Spectroscopy (XPS)
PART VI. Some Progress and Perspective
Chapter 20. Instrumentation Based on Fundamental Progress in Interaction Electromagnetic Wave and Matter, and Electron-Matter Interaction
Erscheinungsjahr: | 2023 |
---|---|
Fachbereich: | Populäre Darstellungen |
Genre: | Chemie, Mathematik, Medizin, Naturwissenschaften, Technik |
Rubrik: | Naturwissenschaften & Technik |
Medium: | Buch |
Inhalt: |
368 S.
19 s/w Illustr. 122 farbige Illustr. 9 s/w Tab. 150 Illustr. |
ISBN-13: | 9783527351091 |
ISBN-10: | 3527351094 |
Sprache: | Englisch |
Herstellernummer: | 1135109 000 |
Einband: | Gebunden |
Autor: |
Song, Yujun
Liao, Qingwei |
Hersteller: | Wiley-VCH GmbH |
Verantwortliche Person für die EU: | Wiley-VCH GmbH, Boschstr. 12, D-69469 Weinheim, product-safety@wiley.com |
Abbildungen: | 19 schwarz-weiße und 122 farbige Abbildungen, 9 schwarz-weiße Tabellen |
Maße: | 247 x 181 x 25 mm |
Von/Mit: | Yujun Song (u. a.) |
Erscheinungsdatum: | 06.09.2023 |
Gewicht: | 0,848 kg |
Qingwei Liao received her PhD degree from Tianjin University, China, in Microelectronics, in 2012, visited Harvard University for one year from 2018 to 2019, and is currently an Associate Professor of Beijing Information Science and Technology University. She has published more than 60 SCI-indexed journal papers. Her research area include: applied physics, nano materials, sensing technology and energy conversion, absorbing materials, ferro/piezo materials. She serves as the main lecturer of courses like Modern analytical testing methods for graduate students.
Chapter 1. Universe, Matter, Condensed Matter and Materials
Chapter 2. Laser Interferometer Gravitational Wave Observatory
Chapter 3. Fundamentals of Crystallography for Microstructure Characterization of Condensed Matter
PART II. Electromagnetic Spectroscopy
Chapter 4. Element of X-Ray Diffraction
Chapter 5. X-Ray Fluorescence Spectroscopy (XRF)
Chapter 6. X-Ray Emission Spectroscopy (XES)
Chapter 7. X-Ray Absorption Spectroscopy (XAS): X-Ray Absorption Near Edge Structure (XANES) and Extended X-Ray Absorption Fine Structure (EXAFS)
Chapter 8. X-Ray Raman Scattering (XRS(
Chapter 9. Fourier Transform Infrared Spectroscopy (FTIR)
Chapter 10. Energy Dispersive X-Ray Spectrum of Elements (EDX)
PART III. Characterization Methods Based on the Particle (Electron or Electron Beam, Neutron)-Matter Interaction
Chapter 11. Scanning Electron Microscope (SEM)
Chapter 12. Transmission Electron Microscope (TEM)
Chapter 13. Spherical Aberration Corrected Transmission Electron Microscope (SAC-TEM)
Chapter 14. Environmental Transmission Electron Microscope (ETEM)
Chapter 15. Holography
PART IV. Characterization Methods for Hyperfine Structures Related to the Magnetic Properties of Electrons and Nuclei
Chapter 16. Nuclear Magnetic Resonance Spectroscopy
Chapter 17. Mössbauer Effect and Mössbauer Spectroscopy
PART V. Surface Analysis Method
Chapter 18. Atomic Force Microscope (AFM)
Chapter 19. X-Ray Photoelectron Spectroscopy (XPS)
PART VI. Some Progress and Perspective
Chapter 20. Instrumentation Based on Fundamental Progress in Interaction Electromagnetic Wave and Matter, and Electron-Matter Interaction
Erscheinungsjahr: | 2023 |
---|---|
Fachbereich: | Populäre Darstellungen |
Genre: | Chemie, Mathematik, Medizin, Naturwissenschaften, Technik |
Rubrik: | Naturwissenschaften & Technik |
Medium: | Buch |
Inhalt: |
368 S.
19 s/w Illustr. 122 farbige Illustr. 9 s/w Tab. 150 Illustr. |
ISBN-13: | 9783527351091 |
ISBN-10: | 3527351094 |
Sprache: | Englisch |
Herstellernummer: | 1135109 000 |
Einband: | Gebunden |
Autor: |
Song, Yujun
Liao, Qingwei |
Hersteller: | Wiley-VCH GmbH |
Verantwortliche Person für die EU: | Wiley-VCH GmbH, Boschstr. 12, D-69469 Weinheim, product-safety@wiley.com |
Abbildungen: | 19 schwarz-weiße und 122 farbige Abbildungen, 9 schwarz-weiße Tabellen |
Maße: | 247 x 181 x 25 mm |
Von/Mit: | Yujun Song (u. a.) |
Erscheinungsdatum: | 06.09.2023 |
Gewicht: | 0,848 kg |